Briana Johnson, Assessor

PARCEL OWNERSHIP HISTORY
Assessor Description
SUNRIDGE LOT 17 AT MACDONALD RANCH PLAT BOOK 73 PAGE 75 LOT 1 BLOCK 4
Current Parcel No. Current Owner % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
178-31-412-004 KAPTANJIAN WARTAN & AYKOUSH 20120807:02232 8/7/2012 RS 505 .17 AC
Parcel No. Prior Owner(s) % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
178-31-412-004 AHMED SHEZHAD
ELKHETTAB FATIMA		 20041013:04412 10/13/2004 JT 505 SUBDIVIDED
LOT
178-31-412-004 AHMED SHEZHAD 20031226:01020 12/26/2003 NS 505 SUBDIVIDED
LOT
178-31-412-004 BANK U S NATIONAL ASSN TRS 20030916:02903 09/16/2003 NS 505 SUBDIVIDED
LOT
178-31-412-004 BILTUCCI JEFFREY 20010124:00359 01/24/2001 NS 505 SUBDIVIDED
LOT
178-31-412-004 MATTORANO JUDI R 19971219:01692 12/19/1997 NS 505 SUBDIVIDED
LOT
178-31-412-004 RICHMOND AMERICAN HOMES NEVADA 19960506:00980 05/06/1996 NS 505 SUBDIVIDED
LOT
178-31-312-001 RICHMOND AMERICAN HOMES NEVADA 19960228:02265 02/28/1996 NS 505 17.79 AC
178-31-312-001 SUNRIDGE DEVELOPMENT COMPANY 19960112:01290 01/12/1996 NS 505 17.79 AC
178-31-310-004 SUNRIDGE DEVELOPMENT COMPANY 19950203:01727 02/03/1995 NS 505 17.93 AC
178-31-301-002 SUNRIDGE DEVELOPMENT COMPANY 19940504:00472 05/04/1994 NS 505 476.37 AC & TO 178-31-610-1 TH 3,710-1,810-1,2
178-31-301-002 SUNRIDGE DEVELOPMENT COMPANY 19940504:00472 05/04/1994 NS 505 476.37 AC TO 178-31-210-4,5,310-1 TH 5,410-1 TH 4
178-31-301-002 SUNRIDGE DEVELOPMENT COMPANY 19940504:00472 05/04/1994 NS 505 476.37 AC C-951107:1416; SF 79-42
178-31-301-002 SUNRIDGE DEVELOPMENT COMPANY 19940504:00472 05/04/1994 NS 505 476.37 AC & FR 178-32-401-001; 12.26A VAC 951107:1415
178-31-301-002 SUNRIDGE DEVELOPMENT COMPANY 19940504:00472 05/04/1994 NS 505 464.11 AC FR 178-31-301-001,801-001,32-301-003,302-002

Click the following link to view the parcel geneology
Parcel Tree

Note:  Only documents from September 15, 1999 through present are available for viewing.

NOTE: THIS RECORD IS FOR ASSESSMENT USE ONLY. NO LIABILITY IS ASSUMED
AS TO THE ACCURACY OF THE DATA DELINEATED HEREON.