Briana Johnson, Assessor

PARCEL OWNERSHIP HISTORY
Assessor Description
ESTRELLA PLAT BOOK 70 PAGE 51 LOT 11 BLOCK A
Current Parcel No. Current Owner % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
163-04-216-011 SALERMO-IZQUIERDO JUDITH
TENG CHUEN K		 20200205:02821 2/5/2020 JT 200 .12 AC
Parcel No. Prior Owner(s) % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
163-04-216-011 SALERMO-IZQUEIRDO JUDITH
TENG CHUEN K		 20190927:03501 09/27/2019 JT 200 SUBDIVIDED
LOT
163-04-216-011 GARCIA JUAN A & MARIA T 20140409:02262 04/09/2014 JT 200 SUBDIVIDED
LOT
163-04-216-011 GARCIA-CASTILLO JUAN A
GARCIA MARIA T		 20131028:03288 10/28/2013 JT 200 SUBDIVIDED
LOT
163-04-216-011 GARIBAY MARIA E ETAL 20130522:01942 05/22/2013 JT 200 SUBDIVIDED
LOT
163-04-216-011 GARIBAY MARIA E 20110421:03361 04/21/2011 NS 200 SUBDIVIDED
LOT
163-04-216-011 GONZALEZ-MARTINEZ JESSICA FANNY 20070404:03179 04/04/2007 NS 200 SUBDIVIDED
LOT
163-04-216-011 GARCIA JUAN A & MARIA T 20010514:01556 05/14/2001 JT 200 SUBDIVIDED
LOT
163-04-216-011 GARCIA JUAN A
MARTINEZ MARIA T		 19980115:01437 01/15/1998 JT 200 SUBDIVIDED
LOT
163-04-216-011 ESTRELLA L L C 19951101:01416 11/01/1995 NS 200 SUBDIVIDED
LOT
163-04-201-001 ESTRELLA L L C 19950421:01456 04/21/1995 NS 200 8.96 AC -.01A COR
163-04-201-001 ETAL">BROWN & CO #54-6697-00-4 ETAL 19890308:00463 03/08/1989 NS 200 8.97 AC 890612:396 RD; -.03A COR; SF 63-32
440-640-004 ETAL">ZEIGER WAYNE L DDS PEN TR ETAL 1315:1274400 11/20/1980 NS 200 9.00 AC
440-640-004 LOVAAS LEELAND M & SYBIL
ZEIGER WAYNE L DDS LTD PEN TR		 0567:0526473 11/04/1975 416 9.00 AC
440-640-004 LOVAAS LEELAND M & SYBIL ETAL 0567:0526473 11/04/1975 120 9.00 AC
440-640-004 BANK FIRST NATL BK NV 0441:0355844 05/01/1963 120 9.00 AC
440-640-004 BANK FIRST NATL BK NV 120 9.00 AC INITIAL

Click the following link to view the parcel geneology
Parcel Tree

Note:  Only documents from September 15, 1999 through present are available for viewing.

NOTE: THIS RECORD IS FOR ASSESSMENT USE ONLY. NO LIABILITY IS ASSUMED
AS TO THE ACCURACY OF THE DATA DELINEATED HEREON.