Briana Johnson, Assessor

PARCEL OWNERSHIP HISTORY
Assessor Description
PINECREST PLAT BOOK 114 PAGE 65 PT LOT 207 BLOCK 6
Current Parcel No. Current Owner % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
176-12-810-220 X O X O EMPIRE L LC 20240509:02705 5/9/2024 NS 635 .05 AC
Parcel No. Prior Owner(s) % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
176-12-810-220 LEE SAMUEL & LYNN 20230809:04486 08/09/2023 NS 635 SUBDIVIDED
LOT
176-12-810-220 MOZEE LISA LIVING TRUST
MOZEE LISA TRS		 20211004:00001 10/04/2021 NS 635 SUBDIVIDED
LOT
176-12-810-220 MOZEE LISA 20210818:02375 08/18/2021 NS 635 SUBDIVIDED
LOT
176-12-810-220 SEAGLE BRADFORD 20170503:02691 05/03/2017 NS 635 SUBDIVIDED
LOT
176-12-810-220 BRIHANU TRUST
BEKELE GIRMA TRS		 20140130:02181 01/30/2014 NS 635 SUBDIVIDED
LOT
176-12-810-220 BRIHANU TIGIST MINWUYELET 20131115:02586 11/15/2013 NS 635 SUBDIVIDED
LOT
176-12-810-220 BRADY D MARK & NANCY ANN 20090610:03503 06/10/2009 RS 635 SUBDIVIDED
LOT
176-12-810-220 BANK DEUTSCHE NATIONAL TR CO TRS 20080828:00460 08/28/2008 NS 635 SUBDIVIDED
LOT
176-12-810-220 BALAORO PRIMO 20050502:03563 05/02/2005 NS 635 SUBDIVIDED
LOT
176-12-810-220 WILLIAMS VOLONTA
LIN ING		 50% NS
50% NS		 20041015:03666 10/15/2004 NS 635 SUBDIVIDED
LOT		 L-20041203:1924
176-12-810-220 LIN ING 20041110:02730 11/10/2004 NS 635 SUBDIVIDED
LOT
176-12-810-220 RICHMOND AMERICAN HOMES NEVADA 20030718:01526 07/18/2003 NS 635 SUBDIVIDED
LOT		 SF 137-84
176-12-810-200 RICHMOND AMERICAN HOMES NEVADA 20030718:01526 07/18/2003 NS 635 SUBDIVIDED
LOT
176-12-801-013 RICHMOND AMERICAN HOMES NEVADA 20030718:01526 07/18/2003 NS 635 19.96 AC A-20040130:1221,20060919:5414
176-12-801-013 RICHMOND AMERICAN HOMES NEVADA 20030718:01526 07/18/2003 NS 635 19.96 AC FR 176-12-801-005,007 TH 010,012; -.03A COR

Click the following link to view the parcel geneology
Parcel Tree

Note:  Only documents from September 15, 1999 through present are available for viewing.

NOTE: THIS RECORD IS FOR ASSESSMENT USE ONLY. NO LIABILITY IS ASSUMED
AS TO THE ACCURACY OF THE DATA DELINEATED HEREON.