Briana Johnson, Assessor

PARCEL OWNERSHIP HISTORY
Assessor Description
SUNSET PINES AT SOUTHWEST RANCH UNIT 2 PLAT BOOK 110 PAGE 71 LOT 55
Current Parcel No. Current Owner % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
176-06-513-055 S F R J V-2 2024-2 BORROWER L L C 20240611:01116 6/11/2024 NS 417 .09 AC
Parcel No. Prior Owner(s) % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
176-06-513-055 S F R J V-2 2024-2 EQUITY OWNER L L C 20240611:01115 06/11/2024 NS 417 .0900 AC
176-06-513-055 S F R J V-2 L P 20240611:01114 06/11/2024 NS 417 .0900 AC
176-06-513-055 S F R J V-2 N T L EQUITY L L C 20240611:01113 06/11/2024 NS 417 .0900 AC
176-06-513-055 S F R J V-2 N T L BORROWER L L C 20221024:00182 10/24/2022 NS 417 SUBDIVIDED
LOT		 C-20221115:1192-1195
176-06-513-055 S F R J V-2 N T L EQUITY L L C 20221019:01752 10/19/2022 NS 417 SUBDIVIDED
LOT
176-06-513-055 S F R J V-2 L P 20221019:00394 10/19/2022 NS 417 SUBDIVIDED
LOT
176-06-513-055 S F R J V-2 EQUITY L L C 20221019:00203 10/19/2022 NS 417 SUBDIVIDED
LOT
176-06-513-055 S F R JV-2 PROPERTY L L C 20210915:03715 09/15/2021 NS 417 SUBDIVIDED
LOT
176-06-513-055 CHIN KEITH A
LAM COLLEEN B		 20110209:03082 02/09/2011 NS 417 SUBDIVIDED
LOT		 C-20210915:3714
176-06-513-055 CHIN KEITH A 20110209:03081 02/09/2011 NS 417 SUBDIVIDED
LOT
176-06-513-055 CHIN KEITH A
CORDOVA CORINA C		 20091009:03458 10/09/2009 NS 417 SUBDIVIDED
LOT
176-06-513-055 BANK NEW YORK MELLON TRS 20090702:03796 07/02/2009 NS 417 SUBDIVIDED
LOT
176-06-513-055 BADALIAN BENIK 20050124:01329 01/24/2005 NS 417 SUBDIVIDED
LOT		 C-20070103:2662
176-06-513-055 K B HOME NEVADA INC 20020607:01782 06/07/2002 NS 417 SUBDIVIDED
LOT		 A-20030715:2871
176-06-501-020 K B HOME NEVADA INC 20020607:01782 06/07/2002 NS 417 14.28 AC FR 176-06-501-003,015; +.09A COR

Click the following link to view the parcel geneology
Parcel Tree

Note:  Only documents from September 15, 1999 through present are available for viewing.

NOTE: THIS RECORD IS FOR ASSESSMENT USE ONLY. NO LIABILITY IS ASSUMED
AS TO THE ACCURACY OF THE DATA DELINEATED HEREON.