Briana Johnson, Assessor

PARCEL OWNERSHIP HISTORY
Assessor Description
CAMBRIDGE PARK #4 PLAT BOOK 13 PAGE 40 LOT 52 BLOCK 11
Current Parcel No. Current Owner % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
161-28-613-032 SUMMIT SQUARE L L C 20231221:01630 12/21/2023 NS 570 .16 AC
Parcel No. Prior Owner(s) % Record Doc No. Record Date Vesting Tax Dist Est Size Comments
161-28-613-032 DELGADO-ARMENDARIZ PATRICIA 20190603:03429 06/03/2019 NS 570 SUBDIVIDED
LOT
161-28-613-032 ABREGO CESAR 20130515:01238 05/15/2013 NS 570 SUBDIVIDED
LOT
161-28-613-032 AVALOS ARMANDO L & LUCY P 20050601:05151 06/01/2005 JT 570 SUBDIVIDED
LOT
161-28-613-032 RAMIREZ JUAN & ADELINA 19980701:02144 07/01/1998 JT 570 SUBDIVIDED
LOT
161-28-613-032 TOBLER WILLIAM E & JEWELL B 19880729:00736 07/29/1988 JT 570 SUBDIVIDED
LOT
230-323-063 SECRETARY HOUSING & URBAN DEV 19880511:00066 05/11/1988 NS 570 SUBDIVIDED
LOT
230-323-063 FIREMANS FUND MORTGAGE CORP 19880321:00311 03/21/1988 NS 570 SUBDIVIDED
LOT
230-323-063 ESTES ELAINE 19871028:00647 10/28/1987 NS 570 SUBDIVIDED
LOT
230-323-063 YEE RONALD
ESTES ELAINE
1/2
1/2
19861114:00922 11/14/1986 NS 570 SUBDIVIDED
LOT
230-323-063 YEE RONALD
CALLAHAN JERRY W & LOUISE N
1/2
1/2
1738:1697200 05/20/1983 NJ 570 SUBDIVIDED
LOT
230-323-063 ESTES ELAINE 1724:1683446 04/26/1983 NS 570 SUBDIVIDED
LOT
230-323-063 DUMKE TR
DUMKE JAMES N & SANDRA D TRS
1188:1147511 02/20/1980 NS 570 SUBDIVIDED
LOT
230-323-063 RETTUS ELAINE 1185:1144655 02/12/1980 NS 570 SUBDIVIDED
LOT
230-323-063 NOGAIM STEPHEN D & PATRICIA D 1078:1037938 06/29/1979 JT 570 SUBDIVIDED
LOT
230-323-063 CHAVEZ CHARLENE 0829:0788119 12/29/1977 570 SUBDIVIDED
LOT
230-323-063 CHAVEZ ROBERT J & CHARLENE 0203:0162363 01/27/1972 570 SUBDIVIDED
LOT
230-323-063 TWIN LAKES VILLAGE INC 570 SUBDIVIDED
LOT
INITIAL

Click the following link to view the parcel geneology
Parcel Tree

Note:  Only documents from September 15, 1999 through present are available for viewing.

NOTE: THIS RECORD IS FOR ASSESSMENT USE ONLY. NO LIABILITY IS ASSUMED
AS TO THE ACCURACY OF THE DATA DELINEATED HEREON.